Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry . Brazilian Journal of Radiation Sciences, Rio de Janeiro, Brazil, v. 10, n. 3B (Suppl.), 2022. DOI: 10.15392/2319-0612.2022.1789. Disponível em: https://bjrs.org.br/revista/index.php/REVISTA/article/view/1789.. Acesso em: 21 nov. 2024.