Semiconductors (LEDs) quality control based in high-resolution 3D X-ray microscope. Brazilian Journal of Radiation Sciences, Rio de Janeiro, Brazil, v. 10, n. 3B (Suppl.), 2022. DOI: 10.15392/2319-0612.2022.1955. Disponível em: https://bjrs.org.br/revista/index.php/REVISTA/article/view/1955.. Acesso em: 22 nov. 2024.