An overview study on the TL and OSL dosimetry patent processes over time. Brazilian Journal of Radiation Sciences, Rio de Janeiro, Brazil, v. 11, n. 01, p. 1–15, 2023. DOI: 10.15392/2319-0612.2023.2107. Disponível em: https://bjrs.org.br/revista/index.php/REVISTA/article/view/2107.. Acesso em: 21 nov. 2024.