Application of bias correction methods to improve U3Si2 sample preparation for quantitative analysis by WDXRF. Braz. J. Radiat. Sci. [Internet]. 7 de febrero de 2019 [citado 17 de julio de 2025];7(2A (Suppl.). Disponible en: https://bjrs.org.br/revista/index.php/REVISTA/article/view/582