Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry . Braz. J. Radiat. Sci. [Internet]. 4 de diciembre de 2022 [citado 17 de julio de 2025];10(3B (Suppl.). Disponible en: https://bjrs.org.br/revista/index.php/REVISTA/article/view/1789