Gonçalves, J.A.C., Bueno, C.C., de Camargo, F. and Pascoalino, K. 2022. Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry . Brazilian Journal of Radiation Sciences. 10, 3B (Suppl.) (Dec. 2022). DOI:https://doi.org/10.15392/2319-0612.2022.1789.