DARUICH DE SOUZA, C.; JONG BUN KIM; JIN JOO KIM; JIN KIM; WANOOK JI; KWANG JAE SON; SANG MU CHOI; GU JIN KANG; JIN TE HONG. The basics of radiation damage in crystalline silicon networks by NIEL. Brazilian Journal of Radiation Sciences, [S. l.], v. 9, n. 3, 2021. DOI: 10.15392/bjrs.v9i3.1707. Disponível em: https://bjrs.org.br/revista_33014/index.php/REVISTA/article/view/1707. Acesso em: 13 nov. 2024.