GONÇALVES, J. A. C.; BUENO, C. C.; DE CAMARGO, F.; PASCOALINO, K. . Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry . Brazilian Journal of Radiation Sciences, [S. l.], v. 10, n. 3B (Suppl.), 2022. DOI: 10.15392/2319-0612.2022.1789. Disponível em: https://bjrs.org.br/revista_33014/index.php/REVISTA/article/view/1789. Acesso em: 25 dec. 2024.