DA COSTA, D.; DOS ANJOS, M.; OLIVEIRA, D.; MACHADO, A.; ASSIS, J.; LOPES, R. Semiconductors (LEDs) quality control based in high-resolution 3D X-ray microscope. Brazilian Journal of Radiation Sciences, [S. l.], v. 10, n. 3B (Suppl.), 2022. DOI: 10.15392/2319-0612.2022.1955. Disponível em: https://bjrs.org.br/revista_33014/index.php/REVISTA/article/view/1955. Acesso em: 6 oct. 2024.