SCAPIN, M. A. Application of bias correction methods to improve U3Si2 sample preparation for quantitative analysis by WDXRF. Brazilian Journal of Radiation Sciences, [S. l.], v. 7, n. 2A (Suppl.), 2019. DOI: 10.15392/bjrs.v7i2A.582. Disponível em: https://bjrs.org.br/revista_33014/index.php/REVISTA/article/view/582. Acesso em: 26 dec. 2024.