ICHIKAWA, R. U.; LINHARES, H. M. da S. M. D.; SILVA, A. S. B.; TEIXEIRA, M. I.; RANIERI, I. M.; TURRILLAS, X.; MARTINEZ, L. G. X-ray diffraction analysis of KY3F10 nanoparticles doped with Nd and preliminary studies for its use in high-dose radiation dosimetry. Brazilian Journal of Radiation Sciences, [S. l.], v. 7, n. 2A (Suppl.), 2019. DOI: 10.15392/bjrs.v7i2A.586. Disponível em: https://bjrs.org.br/revista_33014/index.php/REVISTA/article/view/586. Acesso em: 6 oct. 2024.