da Costa, D., dos Anjos, M., Oliveira, D., Machado, A., Assis, J. and Lopes, R. (2022) “Semiconductors (LEDs) quality control based in high-resolution 3D X-ray microscope”, Brazilian Journal of Radiation Sciences, 10(3B (Suppl.). doi: 10.15392/2319-0612.2022.1955.