da Costa, Diogo, Marcelino dos Anjos, Davi Oliveira, Alessandra Machado, Joaquim Assis, and Ricardo Lopes. “Semiconductors (LEDs) Quality Control Based in High-Resolution 3D X-Ray Microscope”. Brazilian Journal of Radiation Sciences 10, no. 3B (Suppl.) (December 4, 2022). Accessed October 6, 2024. https://bjrs.org.br/revista_33014/index.php/REVISTA/article/view/1955.