da Costa D, dos Anjos M, Oliveira D, Machado A, Assis J, Lopes R. Semiconductors (LEDs) quality control based in high-resolution 3D X-ray microscope. Braz. J. Rad. Sci. [Internet]. 2022 Dec. 4 [cited 2024 Dec. 25];10(3B (Suppl.). Available from: https://bjrs.org.br/revista_33014/index.php/REVISTA/article/view/1955