Santos LR, Vivolo V, Navarro MVT, Xavier M, Potiens M da PA. Filtration influence in a constant potential X-ray machine peak voltage measurements. Braz. J. Rad. Sci. [Internet]. 2017 Jul. 19 [cited 2024 Nov. 9];5(2). Available from: https://bjrs.org.br/revista_33014/index.php/REVISTA/article/view/261