Digital processing of images with defects due to double beam attenuation in indirect X-ray fluorescence mapping

Authors

  • Luisa Dutra Silva Instituto Federal do Rio de Janeiro (IFRJ)
  • Lucas da Costa Souza Universidade do Estado do Rio de Janeiro (UERJ)
  • Davi Ferreira Oliveira Universidade Federal do Rio de Janeiro (UFRJ)
  • Marcelino José Anjos Universidade do Estado do Rio de Janeiro (UERJ)
  • Elicardo Alves de Souza Gonçalves Instituto Federal do Rio de Janeiro https://orcid.org/0000-0003-2612-2690

DOI:

https://doi.org/10.15392/bjrs.v9i2C.1678

Keywords:

Digital image processing, genetic algorithm, X-ray transmission

Abstract

This work is based on the adaptation of a commercial X-ray fluorescence mapping equipment to map the transmission of characteristic X-ray beams through a sample. This adaptation was made without physical adjustments to the equipment, working only on the measurement and data processing parameters. The arrangement of the equipment's components causes not only the primary beam to pass through the sample, but also the resulting characteristic X-rays, causing a double attenuation and a defect in the final image known as ghosting. In this approach, a rudimentary genetic algorithm was developed using artificial images with simulated defects. This algorithm showed the characteristics of the convolution matrix K needed to solve the problem. The results show the real possibility of using the equipment for this adapted measurement and a methodology that can be expanded to different situations.

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References

SCRUGGD,B; HASCHKE, M; HERCZEG, L; NICOLOSI, J. XRF mapping: new tools for distribution analysis. Advances in X-ray analysis, v42, 19-25, 2000.

AMPTEK. X-Ray Fluorescence (XRF): Understanding characteristic x-rays. AMETEK Inc., 2015. 6 p. Disponível em:<http://amptek.com/pdf/characteristic_xrays.pdf>. Acesso em: 19 Jul. 2020.

GONÇALVES, E.A.S; OLIVEIRA, D.F; ANJOS, M.J; ASSIS, J.T; OLIVEIRA, L.F; LOPES, R.T. Visualization method for radiographic films through silver intensity mapping using X-ray fluo-rescence. X-ray spectrometry, v. 46, p. 136-141, 2017.

OMAR, D. The analysis of copper-iron metallic mixture by means of XRD and XRF. Interna-tional Letters of Chemistry, Physics and Astronomy, v.64, p.130-134. 2017.

STEPHAN, K; HIRSCHINGER, M; MAIER, H; FRISKE, D. Characterization of thin films by X-ray transmission measurements. Nuclear Instruments and Methods in Physics Research Sec-tion A, v.397, n.1, p.150-158, 1997.

HUANG, S; WANG, X; CHEN, Y; XU, J; TANG, T; MU, B. Modeling and quantitative analy-sis of X-ray transmission and backscatter imaging aimed at security inspection, Optics express, V27, n. 2, p.337-349, 2019.

ALAM, T; QAMAR, S; DIXIT, A; BENAIDA, M. Genetic Algorithm: Reviews, Implementa-tions, and Applications, International Journal of Engineering Pedagogy, Preprints, 2020.

GONZALEZ, R.; WOODS, R; EDDINS, S. Digital Image Processing Using Matlab. Prentice Hall, 2003

OCTAVE FORGE. Function reference: deconvwnr. Octave Forge Community, 2020. Disponível em <https://octave.sourceforge.io/image/function/deconvwnr.html>. Acessado em 22 de out. 2020

BRUKER NANO GMBH. M4 Tornado User Manual. Berlim: Bruker Nano GmbH, 2013, 165p.

EATON, J.W; BATEMAN, D; HAUBERG,S; WEHBRING, R. GNU Octave version 5.2.0 manual: a high-level interactive language for numerical computations. Disponível em <https://www.gnu.org/software/octave/doc/v5.2.0/> Acesso em 22 de out. 2020

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Published

2021-08-08

How to Cite

Silva, L. D., Souza, L. da C., Oliveira, D. F., Anjos, M. J., & Gonçalves, E. A. de S. (2021). Digital processing of images with defects due to double beam attenuation in indirect X-ray fluorescence mapping. Brazilian Journal of Radiation Sciences, 9(2C (Suppl.). https://doi.org/10.15392/bjrs.v9i2C.1678

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Section

Congresso Brasileiro de Metrologia das Radiações Ionizantes - CBMRI 2020

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