Application of bias correction methods to improve U3Si2 sample preparation for quantitative analysis by WDXRF

Authors

  • Marcos Antonio Scapin Instituto de Pesquisas Energéticas e Nucleares

DOI:

https://doi.org/10.15392/bjrs.v7i2A.582

Keywords:

U3Si2, XRF, WDXRF.

Abstract

The determination of silicon (Si), total uranium (U) and impurities in uranium-silicide (U3Si2) samples by wavelength dispersion X-ray fluorescence technique (WDXRF) has been already validated and is currently implemented at IPEN’s X-Ray Fluorescence Laboratory (IPEN-CNEN/SP) in São Paulo, Brazil. Sample preparation requires the use of approximately 3 g of H3BO3 as sample holder and 1.8 g of U3Si2. However, because boron is a neutron absorber, this procedure precludes U3Si2 sample’s recovery, which, in time, considering routinely analysis, may account for significant unusable uranium waste. An estimated average of 15 samples per month is expected to be analyzed by WDXRF, resulting in approx. 320 g of U3Si2 that wouldn’t return to the nuclear fuel cycle. This not only impacts in production losses, but generates another problem: radioactive waste management. The purpose of this paper is to present the mathematical models that may be applied for the correction of systematic errors when H3BO3 sample holder is substituted by cellulose-acetate {[C6H7O2(OH)3-m(OOCCH3)m], m = 0~3}, thus enabling U3Si2 sample’s recovery. The results demonstrate that the adopted mathematical model is statistically satisfactory, allowing the optimization of the procedure.U3Si2, XRF, WDXRF.

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Author Biography

  • Marcos Antonio Scapin, Instituto de Pesquisas Energéticas e Nucleares
    Possui Bacharelado e Licenciatura em Ciências com Habilitação em Química, Mestrado e Doutorado em Ciências na área de Tecnologia Nuclear pelo IPEN-USP. Atualmente desenvolve  atividades de análises químicas e físicas por meio das técnicas de fluorescência de raios X e microscopia eletrônica nos Centros de Química e Meio Ambiente e Lasers e Aplicações no Instituto de Pesquisas Energéticas e Nucleares (IPEN/CNEN-SP). As atividades de pesquisas estão concentradas no desenvolvimento de metodologias para o estudo de materiais aplicados nas diferentes áreas de conhecimento, como nuclear, nanotecnologia, ambiental, saúde forense e outras, com ênfase nas técnicas de fluorescência de raios X e microscopia eletrônica.

References

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M. A. SCAPIN, M. B. E. COTRIM, C. P. SILVA, M. A. F. PIRES, Application of multivari-ate calibration for simultaneous determination of major and minor constituents in U3Si2 by WDXRF technique. J. Radioanal. Nucl. Chem., DOI 10.1007/s10967-014-3332-6, 2014.

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Published

2019-02-07

Issue

Section

The Meeting on Nuclear Applications (ENAN)

How to Cite

Application of bias correction methods to improve U3Si2 sample preparation for quantitative analysis by WDXRF. Brazilian Journal of Radiation Sciences, Rio de Janeiro, Brazil, v. 7, n. 2A (Suppl.), 2019. DOI: 10.15392/bjrs.v7i2A.582. Disponível em: https://bjrs.org.br/revista/index.php/REVISTA/article/view/582.. Acesso em: 21 nov. 2024.

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