Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector
DOI:
https://doi.org/10.15392/bjrs.v9i2C.1665Keywords:
X-ray Spectrometry, CdTe Spectrometer, ISO 4037-1Abstract
The X-ray spectrometry is subject to a diversity of problems that distort the measured beam. To observe them, spectra from N20, N25, N30, N60, N80, and N100 radiation qualities were obtained and evaluated their non-correction impact in the values of mean energy when compared with the requirements on ISO 4037-1 standard. The error percentages calculated were 2%, 2%, 2%, 11%, 9%, and 6%, respectively, related to partial energy deposition, efficiency loss, and charge trapping. These results suggest the need for correction of measured spectra, mainly for voltages higher than 30 kV.
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